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4 in 1 Mega-Idea Motherboard Layered Test Fixture for iPhone 17 Series

SKU: EDA0089215
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Regular price R 6,059.00
Regular price Sale price R 6,059.00
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6-13 business days

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Processing time: 1-3 days

Description

The 4 in 1 Mega-Idea Motherboard Layered Test Fixture is designed for testing the motherboards of iPhone 17 series devices. It addresses common issues encountered during motherboard testing, ensuring accurate data collection and stability.

  • Product Type: Repair Fixture
  • Compatibility: iPhone 17, iPhone 17 Air, iPhone 17 Pro, iPhone 17 Pro Max
  • Material: BeCu spring probes
  • Key Feature: Layered test design
  • Intended Use: Motherboard testing
  • Manufacturing Process: CNC high-precision machining
  • Probe Type: Double-headed probe for accurate alignment
  • Stability Features: Fixed buckles to prevent motherboard warping
  • Conductivity: Good conductivity with stable overload and low deviation in detected values
  • Probe Characteristics: Tapered probe resistant to rosin and solder contamination
  • Spring Mechanism: Spring buckle for quick rebound
  • Foot Pads: Anti-slip, wear-resistant foot pads for stability

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